In general, the half width of X-ray diffraction is used as a strength index of material surface.
通常用X射线衍射线的半高宽作为材料表面的强度指标。
The resolution index of electron diffraction in TEM is analyzed. The exactly experimental method is given for demarcating electron diffraction camera length by Gold-monocrystal in TEM.
同时对TEM中的电子衍射分辨率指数进行了分析和讨论，并给出了实际应用金单晶标样精确标定TEM电子衍射相机长度的实验方法。
Birefractive index and Bragg diffraction have been oboserved and measured in the crystals.
测量和研究了晶体的双折射率和布喇格衍射。
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